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Experimental assessment of logic circuit performance variability with regular fabrics at 90nm technology node.

Sungdae ChoiKatsuyuki IkeuchiHyunkyung KimKenichi InagakiMasami MurakataNobuyuki NishiguchiMakoto TakamiyaTakayasu Sakurai
Published in: ESSCIRC (2008)
Keyphrases
  • digital circuits
  • pattern recognition
  • nm technology
  • real time
  • social networks
  • low cost
  • high speed
  • logic programming
  • multi valued
  • logic circuits