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An efficient reliability simulation flow for evaluating the hot carrier injection effect in CMOS VLSI circuits.
Mehdi Kamal
Qing Xie
Massoud Pedram
Ali Afzali-Kusha
Saeed Safari
Published in:
ICCD (2012)
Keyphrases
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vlsi circuits
low power
navier stokes equations
low cost
computational fluid dynamics
reliability assessment
real time
power consumption
flow field
pattern recognition
high speed
multi view
fluid dynamics