Wafer Map Defect Patterns Classification using Deep Selective Learning.
Mohamed Baker AlawiehDuane S. BoningDavid Z. PanPublished in: DAC (2020)
Keyphrases
- supervised learning
- learning process
- learning algorithm
- online learning
- image classification
- learning systems
- structured output
- classification scheme
- classification accuracy
- reinforcement learning
- active learning
- unsupervised learning
- incremental learning
- prior knowledge
- learning phase
- rule learning
- pattern classification
- machine learning algorithms
- data mining
- class labels
- classification method
- learning problems
- support vector
- feature extraction
- data mining techniques
- deep learning
- feature set