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Comparison of RTL fault models for the robustness evaluation of aerospace FPGA devices.

Romain ChamponVincent BeroulleAthanasios PapadimitriouDavid HélyGilles GenévrierFrédéric Cézilly
Published in: IOLTS (2016)
Keyphrases
  • fault models
  • information systems
  • low cost
  • model based diagnosis
  • embedded systems