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Study on Avalanche Uniformity in 1.2KV GaN Vertical PIN Diode with Bevel Edge-Termination.

Ke ZengSrabanti ChowdhuryBrendan GunningRobert KaplarTravis Anderson
Published in: IRPS (2021)
Keyphrases
  • empirical studies
  • experimental study
  • transmission line
  • database
  • statistical analysis
  • edge information
  • machine learning
  • information systems
  • image processing