Maximal margin feature mapping via basic image descriptors for image classification.
Changchen ZhaoChun-Liang LinWeihai ChenPublished in: ICIT (2016)
Keyphrases
- image descriptors
- feature mapping
- image classification
- feature space
- image representation
- image features
- multiple instance learning
- feature extraction
- similarity measure
- visual features
- local binary pattern
- hyperplane
- distance function
- multi label
- svm classifier
- neural network
- multi class
- sparse representation
- support vector machine
- pairwise
- learning algorithm