Ultrafast Focus Detection for Automated Microscopy.
Maksim LeventalRyan ChardKyle ChardIan T. FosterGregg A. WildenbergPublished in: ICCS (1) (2022)
Keyphrases
- automated analysis
- object detection
- detection algorithm
- detection method
- detection accuracy
- automatic detection
- false alarms
- detection rate
- data structure
- computer assisted
- false positives
- automated detection
- databases
- image enhancement
- hough transform
- anomaly detection
- data driven
- digital images
- multiscale
- bayesian networks
- three dimensional
- image segmentation
- website
- artificial intelligence