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Thermal analysis of a 3D die-stacked high-performance microprocessor.

Kiran PuttaswamyGabriel H. Loh
Published in: ACM Great Lakes Symposium on VLSI (2006)
Keyphrases
  • statistical analysis
  • neural network
  • search algorithm
  • image analysis
  • infrared
  • real time
  • feature selection
  • knowledge base
  • case study
  • cost effective