SCARE: Side-Channel Analysis Based Reverse Engineering for Post-Silicon Validation.
Xinmu WangSeetharam NarasimhanAswin Raghav KrishnaSwarup BhuniaPublished in: VLSI Design (2012)
Keyphrases
- reverse engineering
- software engineering
- dynamic analysis
- software maintenance
- object oriented
- low cost
- program understanding
- software product
- high speed
- conceptual schema
- computer aided design
- gene regulatory networks
- reverse engineer
- software evolution
- software engineers
- high density
- legacy systems
- genetic regulatory networks
- data sets
- platform independent
- business rules
- machine learning
- databases