Soft failures in integrated circuits as a matter of ESD events.
Timm OstermannPublished in: ICICDT (2018)
Keyphrases
- integrated circuit
- event detection
- electron beam
- failure detection
- complex events
- temporal relations
- component failures
- failure recovery
- video event
- abnormal events
- printed circuit boards
- event recognition
- event sequences
- database
- parallel computing
- temporal patterns
- temporal information
- low cost
- spatio temporal
- image processing
- genetic algorithm
- data sets