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Probabilistic model for nanocell reliability evaluation in presence of transient errors.

Renu KumawatVineet SahulaManoj Singh Gaur
Published in: IET Comput. Digit. Tech. (2015)
Keyphrases
  • probabilistic model
  • steady state
  • real time
  • language model
  • case study
  • bayesian networks
  • real world
  • multiresolution
  • generative model
  • evaluation method
  • evaluation model