C
search
search
reviewers
reviewers
feeds
feeds
assignments
assignments
settings
logout
Bilateral Testing of Nano-scale Fault-Tolerant Circuits.
Lei Fang
Michael S. Hsiao
Published in:
J. Electron. Test. (2008)
Keyphrases
</>
fault tolerant
nano scale
fault tolerance
distributed systems
state machine
safety critical
high speed
load balancing
high availability
mobile agent system
message passing
circuit design
digital circuits
multistage
markov random field
fault isolation
multimedia