Parallel-beam X-ray CT datasets of apples with internal defects and label balancing for machine learning.
Sophia Bethany CobanVladyslav AndriiashenPoulami Somanya GangulyMaureen van EijnattenKees Joost BatenburgPublished in: CoRR (2020)
Keyphrases
- machine learning
- machine learning methods
- x ray
- motion compensated
- learning algorithm
- decision trees
- parallel processing
- artificial intelligence
- feature selection
- pattern recognition
- defect detection
- cross section
- machine learning algorithms
- multislice
- internal and external
- explanation based learning
- class labels
- support vector machine
- active learning
- computer vision
- data sets
- learning systems
- text classification
- medical images
- motion compensation
- computational intelligence
- inductive logic programming
- information extraction
- parallel implementation
- parallel computing
- knowledge discovery
- computer science