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Deterministic identity testing of depth 4 multilinear circuits with bounded top fan-in.
Zohar Shay Karnin
Partha Mukhopadhyay
Amir Shpilka
Ilya Volkovich
Published in:
Electron. Colloquium Comput. Complex. (2009)
Keyphrases
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higher order
high speed
depth information
depth map
truth table
high quality
test cases
high order
delay insensitive
feature space
low cost
depth estimation