Gate-Level Exception Handling Design for Noise Reduction in High-Speed VLSI Circuits.
Sanghoan ChangGwan ChoiPublished in: VLSI Design (2007)
Keyphrases
- noise reduction
- exception handling
- vlsi circuits
- high speed
- edge detection
- signal to noise ratio
- conflict resolution
- conceptual framework
- object oriented programming
- low power
- object oriented
- case study
- database
- business processes
- model based diagnosis
- general purpose
- design methodology
- noisy environments
- design considerations
- user interface