Characterization of the immunity of integrated circuits (ICs) at wafer level.

Andrea Lavarda Dominik Amschl Susanne Bauer Bernd Deutschmann

Published in: EMC Compo (2015)

Keyphrases

integrated circuit
electron beam
data sets
higher level
multi objective optimization
levels of abstraction
database
data mining
genetic algorithm
case study
evolutionary algorithm
multi objective
production system
lower level