Fast statistical analysis of rare circuit failure events via Bayesian scaled-sigma sampling for high-dimensional variation space.
Shupeng SunXin LiPublished in: CICC (2015)
Keyphrases
- statistical analysis
- high dimensional
- parameter space
- low dimensional
- input space
- lower dimensional
- high speed
- feature space
- higher dimensional
- clinical data
- data points
- kernel space
- high dimensional spaces
- bayesian networks
- search space
- similarity search
- metric space
- posterior probability
- statistical methods
- dimensionality reduction
- random sampling
- gaussian processes
- high dimensional data
- dimensional data
- importance sampling
- event detection
- failure rate
- rare events
- monte carlo