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Exploiting Input Parameter Uncertainty for Reducing Datapath Precision of SPICE Device Models.

Nachiket Kapre
Published in: FCCM (2013)
Keyphrases
  • high precision
  • real time
  • image sequences
  • prior knowledge
  • input parameters
  • markov random field
  • input data
  • model selection
  • statistical models
  • statistical methods
  • precision and recall
  • parametric models