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Evaluation of Heavy-Ion-Induced Single Event Upset Cross Sections of a 65-nm Thin BOX FD-SOI Flip-Flops Composed of Stacked Inverters.
Kentaro Kojima
Kodai Yamada
Jun Furuta
Kazutoshi Kobayashi
Published in:
IEICE Trans. Electron. (2020)
Keyphrases
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cross sections
cross sectional
cross section
computer aided
low power