Bayesian Deep Active Learning for Analog Circuit Performance Classification.
Lining ZhangSalahuddin RajuAshish JamesRahul DuttaGregoire FournierDamien LancryKevin Chai Tshun ChuanVijay Ramaseshan ChandrasekharChuan Sheng FooPublished in: ISCAS (2022)
Keyphrases
- active learning
- analog circuits
- classification accuracy
- pattern recognition
- selective sampling
- supervised learning
- wavelet packet transform
- batch mode active learning
- training set
- decision trees
- machine learning
- fault diagnosis
- feature space
- belief nets
- support vector machine
- annotation effort
- feature extraction
- cost sensitive
- bayesian methods
- semi supervised
- random sampling
- training samples
- real time
- support vector
- bayesian networks
- neural network