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Short channel models and scaling limits of SOI and bulk MOSFETs.

Bhavna AgrawalVivek K. DeJoseph M. PimbleyJames D. Meindl
Published in: IEEE J. Solid State Circuits (1994)
Keyphrases
  • data sets
  • probabilistic model
  • accurate models
  • model selection
  • statistical model
  • prior knowledge
  • process model
  • statistical models
  • bayesian framework