Non-Destructive Imaging of Insulated Gate Bipolar Transistor Power Modules.
Sharhts S. BugingoPeter FreereRoss SchultzFrikkie C. De BeerXandri van NiekerkPublished in: AFRICON (2019)
Keyphrases
- field effect transistors
- high density
- steady state
- mathematical analysis
- imaging systems
- image processing
- power consumption
- high resolution
- image analysis
- building blocks
- synthetic aperture sonar
- modular structure
- acquired images
- medical imaging
- markov chain
- data center
- power dissipation
- computer vision
- neural network