Digital background calibration of redundant split-flash ADC in 45nm CMOS.
Rabeeh MajidiAnthony CrassoJohn A. McNeillPublished in: ISCAS (2012)
Keyphrases
- analog to digital converter
- metal oxide semiconductor
- circuit design
- low cost
- cmos technology
- cmos image sensor
- low power
- mixed signal
- high speed
- camera calibration
- single chip
- sigma delta
- nm technology
- image sensor
- foreground objects
- integrated circuit
- power consumption
- computer vision
- silicon on insulator
- analog vlsi
- low voltage
- power supply
- camera parameters
- x ray