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Improving the Winding Angle Measurement for an Effective Process Control.

Giulio D'EmiliaLuciano ChiomintoEmanuela NataleAntonios G. Stamopoulos
Published in: I2MTC (2024)
Keyphrases
  • process control
  • control system
  • semiconductor manufacturing
  • product quality
  • database
  • machine learning
  • genetic algorithm
  • manufacturing process
  • data sets
  • real world
  • computer vision
  • feature selection