Dielectric-Parameter Measurements of SiC at Millimeter and Submillimeter Wavelengths.

Shu Chen Mohammed N. Afsar D. Sakdatorn

Published in: IEEE Trans. Instrum. Meas. (2008)

Keyphrases

infrared
real time
sensor measurements
database
single parameter
design parameters
parameter values
case study
neural network
steady state
social networks
parameter settings
input parameters
genetic algorithm
measurement data
measurement noise
data sets