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Reliability Enhancement of SoCs Based on Dynamic Memory Access Profiling in Conjunction with PVT Monitoring.

Deepak BaranwalDigvijay SinghKhanusiya SoyebSidhartha Sankar RoutSujay Deb
Published in: VLSI Design (2015)
Keyphrases
  • memory access
  • real time
  • image processing
  • databases
  • main memory
  • data mining
  • computational complexity
  • multi dimensional
  • data access
  • external memory