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Reliability Enhancement of SoCs Based on Dynamic Memory Access Profiling in Conjunction with PVT Monitoring.
Deepak Baranwal
Digvijay Singh
Khanusiya Soyeb
Sidhartha Sankar Rout
Sujay Deb
Published in:
VLSI Design (2015)
Keyphrases
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memory access
real time
image processing
databases
main memory
data mining
computational complexity
multi dimensional
data access
external memory