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Determination of the Interface between Amorphous Insulator and Crystalline 4H-SiC in Transmission Electron Microscope Image by using Convolutional Neural Network.
Hironori Yoshioka
Tomonori Honda
Published in:
CoRR (2020)
Keyphrases
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electron microscope
convolutional neural network
input image
x ray
image analysis
three dimensional
image segmentation
multiscale
high resolution
edge detection
test images
neural network
image classification
image sequences
wavelet transform
super resolution
denoising methods