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Harmony: static noise analysis of deep submicron digital integrated circuits.
Kenneth L. Shepard
Vinod Narayanan
Ron Rose
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1999)
Keyphrases
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integrated circuit
electron beam
real time
three dimensional
image sequences
quantitative analysis
data sets
learning algorithm
case study
multiscale
data analysis
statistical analysis
vlsi circuits