Robust dislocation defects region segmentation for polysilicon wafer image.

Haiyong Chen Jiali Liu Shuang Wang Kun Liu Peng Yang

Published in: ICAC (2018)

Keyphrases

region segmentation
image segmentation
perceptual grouping
image content
input image
image representation
image classification
image features
image data
edge detector
image analysis
global features
multiscale
test images
single image
segmented regions
vision system
feature maps
image retrieval
object recognition
similarity measure