Yield-aware time-efficient testing and self-fixing design for TSV-based 3D ICs.

Jing Xie Yu Wang Yuan Xie

Published in: ASP-DAC (2012)

Keyphrases

case study
engineering design
artificial intelligence
cost effective
genetic algorithm
test cases
building blocks
lightweight
evolutionary algorithm
neural network
artificial neural networks
software development
search algorithm
data structure
design process
multimedia
feature selection
software testing