Sign in

25.7 Time-Borrowing Fast Mux-D Scan Flip-Flop with On-Chip Timing/Power/VMIN Characterization Circuits in 10nm CMOS.

Amit AgarwalSteven HsuSimeon RealovMark A. AndersGregory K. ChenMonodeep KarRaghavan KumarHuseyin SumbulPhil C. KnagHimanshu KaulSanu MathewMahesh KumashikarRam KrishnamurthyVivek De
Published in: ISSCC (2020)
Keyphrases