Test method for capacitive MEMS devices utilizing pierce oscillator.
Ali DianatAli AttaranRashid RashidzadehPublished in: ISCAS (2015)
Keyphrases
- main contribution
- high precision
- high accuracy
- computational cost
- test data
- detection method
- cost function
- optimization method
- experimental study
- k means
- computational complexity
- image sequences
- significant improvement
- experimental evaluation
- prior knowledge
- em algorithm
- theoretical analysis
- mobile devices
- support vector machine svm
- optimization algorithm
- preprocessing
- error rate
- synthetic data
- training data
- computer vision