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A 65 nm standard cell library for ultra low-power applications.

Marten VohrmannSaikat ChatterjeeSven LütkemeierThorsten JungeblutMario PorrmannUlrich Rückert
Published in: ECCTD (2015)
Keyphrases
  • ultra low power
  • data sets
  • databases
  • data mining
  • three dimensional
  • x ray