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A Calibration Technique for Pipelined ADCs Using Self-Measurement and Histogram-Based Test Methods.

Tohid MoosazadehMohammad Yavari
Published in: IEEE Trans. Circuits Syst. II Express Briefs (2015)
Keyphrases
  • test data
  • object recognition
  • benchmark datasets
  • real time
  • computational cost
  • medical images