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Analysis and Classification of Event-Related Potentials During Image Observation.
Diego Quattrone
Francesco Santambrogio
Andrea Scarpellini
Francesco Sgherzi
Isabella Poles
Letizia Clementi
Marco Domenico Santambrogio
Published in:
EMBC (2023)
Keyphrases
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image classification
image analysis
image data
pattern classification
input image
image features
image retrieval
machine learning
multiscale
eeg signals
similarity measure
pattern recognition
high resolution
learning process
wavelet transform
classification accuracy
feature space
feature selection
computer vision