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-based resistive switching memory at nanoscale by conductive atomic force microscopy.
Shih-Hung Lin
You-Lin Wu
Yu-Huei Hwang
Jing-Jenn Lin
Published in:
Microelectron. Reliab. (2015)
Keyphrases
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atomic force microscopy
real world
artificial intelligence
memory requirements
computational power
neural network
genetic algorithm
information systems
feature selection
website
relational databases
artificial neural networks
limited memory
memory size
memory footprint
low memory