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An Accelerated Jitter Tolerance Test Technique on Ate for 1.5GB/S and 3GB/S Serial-ATA.

Yongquan FanYi CaiLiming FangAnant VermaWilliam BurchanowskiZeljko ZilicSandeep Kumar
Published in: ITC (2006)
Keyphrases
  • high speed
  • artificial intelligence
  • database systems
  • learning environment
  • computational complexity
  • test cases