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Generic Lithography Modeling with Dual-band Optics-Inspired Neural Networks.
Haoyu Yang
Zongyi Li
Kumara Sastry
Saumyadip Mukhopadhyay
Mark Kilgard
Anima Anandkumar
Brucek Khailany
Vivek Singh
Haoxing Ren
Published in:
CoRR (2022)
Keyphrases
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neural network
dual band
fault diagnosis
image processing
multiscale