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Generic Lithography Modeling with Dual-band Optics-Inspired Neural Networks.

Haoyu YangZongyi LiKumara SastrySaumyadip MukhopadhyayMark KilgardAnima AnandkumarBrucek KhailanyVivek SinghHaoxing Ren
Published in: CoRR (2022)
Keyphrases
  • neural network
  • dual band
  • fault diagnosis
  • image processing
  • multiscale