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Verification of the Current Load Capacity of The MOSFET Transistor for Low-Voltage Application Using Temperature Estimation.

Jan StepánekBedrich BednárPavel Drábek
Published in: ISIE (2019)
Keyphrases
  • low voltage
  • power line
  • leakage current
  • design considerations
  • real time
  • high speed
  • video data
  • power management
  • cmos technology