Joint Feature and Label Adversarial Network for Wafer Map Defect Recognition.
Jianbo YuZongli ShenXiaoyun ZhengPublished in: IEEE Trans Autom. Sci. Eng. (2021)
Keyphrases
- recognition accuracy
- recognition rate
- object recognition
- network model
- computer networks
- communication networks
- image features
- peer to peer
- character recognition
- maximum a posteriori
- recognition algorithm
- network structure
- activity recognition
- multi label
- recognition process
- multi agent
- feature fusion
- binary images
- image classification
- wireless sensor networks
- pattern recognition