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Reliability Analysis of Large Circuits Using Scalable Techniques and Tools.

Debayan BhaduriSandeep K. ShuklaPaul S. GrahamMaya B. Gokhale
Published in: IEEE Trans. Circuits Syst. I Regul. Pap. (2007)
Keyphrases
  • reliability analysis
  • high speed
  • artificial intelligence
  • expert systems
  • decision support
  • fault tree