The Impact of Scaling on the Effects of Mixed-Mode Electrical Stress and Ionizing Radiation for 130-nm and 90-nm SiGe HBTs.
Delgermaa NerguiM. HosseinzadehY. A. MensahH. P. LeeD. G. SamK. LiE. X. ZhangDaniel M. FleetwoodJohn D. CresslerPublished in: IRPS (2024)