Partial Scan Electron Microscopy with Deep Learning.

Jeffrey M. Ede Richard Beanland

Published in: CoRR (2019)

Keyphrases

deep learning
electron microscopy
x ray
low energy
image stacks
machine learning
unsupervised feature learning
unsupervised learning
thin film
weakly supervised
mental models
supervised learning
dimensionality reduction
maximum likelihood
tubular structures
deep architectures