Machine Learning Assisted Statistical Variation Analysis of Ferroelectric Transistors: From Experimental Metrology to Predictive Modeling.
Gihun ChoePrasanna Venkatesan RavindranAnni LuJae HurMaximilian LedererAndré ReckSarah LombardoNashrah AfrozeJosh KacherAsif Islam KhanShimeng YuPublished in: VLSI Technology and Circuits (2022)
Keyphrases
- predictive modeling
- machine learning
- statistical analysis
- statistical modeling
- statistical data mining
- data analysis
- exploratory data analysis
- real world
- statistical models
- text mining
- information extraction
- knowledge discovery
- distance function
- regression model
- power consumption
- big data
- knowledge representation
- data sets