Login / Signup
Reducing the susceptibility of design-for-delay-testability structures to process- and application-induced variations.
Herman J. Vermaak
Hans G. Kerkhoff
Published in:
ETW (2001)
Keyphrases
</>
design process
application specific
artificial intelligence
platform independent
design processes
design requirements
real time
e learning
learning environment
development process
design space
development lifecycle