Dark noise in a CMOS imager pixel with negative bias on transfer gate.
Hirofumi YamashitaMotohiro MaedaShogo FuruyaTakanori YagamiPublished in: Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications (2011)
Keyphrases
- image sensor
- focal plane
- infrared
- cmos technology
- power consumption
- imaging systems
- high speed
- video camera
- dynamic range
- analog vlsi
- noisy data
- low power
- positive and negative
- signal to noise ratio
- weighted averaging
- missing data
- noise model
- noise reduction
- transfer learning
- input image
- denoising
- switching median filter
- gaussian noise
- image pixels
- digital camera
- pixel intensities
- image processing algorithms
- circuit design
- single chip
- motion blur
- transformed image
- delay insensitive
- noise level
- metal oxide semiconductor
- low cost