Vertical and lateral charge losses during short time retention in 3-D NAND flash memory.
Yongwoo LeeJinsu YoonKwangmin LimBongsik ChoiGeon-Hwi ParkJu Won JeonJong-Ho BaeDong Myong KimDae Hwan KimEunmee KwonSung-Jin ChoiPublished in: ESSDERC (2021)
Keyphrases
- flash memory
- garbage collection
- solid state
- buffer management
- file system
- random access
- main memory
- embedded systems
- secondary storage
- disk drives
- b tree
- database systems
- data storage
- hand held devices
- storage systems
- memory management
- storage devices
- small size
- real time
- storage management
- training set
- data structure
- data mining