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Thermal analysis and model identification techniques for a logic + WIDEIO stacked DRAM test chip.

Francesco BeneventiAndrea BartoliniPascal VivetDenis DutoitLuca Benini
Published in: DATE (2014)
Keyphrases
  • probabilistic model
  • computational model
  • objective function
  • low cost
  • empirical data
  • data analysis
  • artificial neural networks
  • formal model