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Active ESD protection circuit design against charged-device-model ESD event in CMOS integrated circuits.

Shih-Hung ChenMing-Dou Ker
Published in: Microelectron. Reliab. (2007)
Keyphrases
  • circuit design
  • integrated circuit
  • probabilistic model
  • computational model
  • mathematical model
  • high level
  • low cost
  • probability distribution
  • statistical model