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Characterization of etched and Unetched Vertically Aligned Carbon Nanofibers (VACNFs) using Atomic Force Microscopy.

Siva Naga Sandeep ChalamalasettyUchechukwu C. WejinyaZhuxin Dong
Published in: IROS (2010)
Keyphrases
  • atomic force microscopy
  • database
  • probability distribution
  • knowledge base
  • mobile devices
  • special case
  • carbon dioxide
  • axiomatic characterization